NanoX-Pert AdvancedMaterials

//NanoX-Pert AdvancedMaterials

NanoX-Pert your Micro- and Nanoanalytics Seminar & Individual Analysis

Nano X-Pert represents our inhouse seminars, which give you an overview of the most important nano-analytical methods by an interdisciplinary approach. The power of our techniques is the delivery of detailed analytical information. Get your individual first impression using the unique opportunity of a free test measurement.  Our Scientists will work with you to solve your analytical challenge.

The seminar introduces nano-analytical methods in the following areas:

  • Surface Analysis (XPS; TOF-SIMS & AES)
  • Combination of AFM-IR Spectroscopy ; submicron IR Microscope


Free coupon for a private measurement day and the unique opportunity to get an individual impression of the potential of our techniques with your samples.

This means in detail, a complete day in our lab to test our surface science methods XPS, TOF-SIMS & AES (possible as combination-Analysis too).

Latest developments in surface analysis like Parallel Imaging MS/MS – NEW! Changing TOF-SIMS from I Think to I know!, will be shown. What is / Why XPS/HAXPES ?  Dual Scanning X-ray Photoelectron Microprobe Equipped with Hard X-Ray will be presented in all NanoX-Pert Seminars.


Contact us

Physical Electronics GmbH
Fraunhoferstr. 4
85737 Ismaning

Your contact person:
Telefon: +49 89 96275 0