PHI nanoTOF II
Changing TOF-SIMS from „I Think“ to „I know“!
The superior performance patented TRIFT analyzer realized improvement of product performance and manage process control. TOF-SIMS is ideal for organic or inorganic materials, and can be used to characterize both insulating and conducting samples.
With detection limits in the ppm to ppb range, shallow depth profiling capabilities and automated analysis, the nanoTOF can be used to analyze surface contamination, trace impurities, thin films, and delamination failures.
- Parallel Imaging MS/MS – NEW! Changing TOF-SIMS from I Think to I know!
- Superior TRIFT Analyzer Performance
- HR²: High spatial resolution with high mass resolution
- Cluster Source Ion Guns
- FIB-TOF 3D Chemical Imaging