With the most surface-sensitive analysis methods (XPS, TOF-SIMS and AES) we can detect substances, even organic, in the slightest traces. Extremely thin deposits (atomic monolayers) can be detected, in very small (micrometer) areas.
Thin layer systems can be measured up to a total thickness of a few micrometers for ist composition and individual thicknesses in the nanometer range.
Our contract analysis reliably deliver fast answers in understandable form. Our contract analysis laboratory is under one roof with the service of the equipment manufacturer and therefore we always have the equipment in top condition. Many years of experience of the analysts, who cooperate closely with the device manufacturer in the international environment, guarantee the best possible quality of the measurement data and their interpretation.