Atomic Force Microscope LiteScope™ from NenoVision
– the most advanced AFM-in-SEM on the market
You know AFM and you know SEM – the two most used complementary techniques for sample analysis in the (sub)nanometre range.
But do you also know AFM-in-SEM?
Combine both techniques and use their advantages together!
Why is it worth thinking about?
The AFM-in-SEM approach combines the strengths of atomic force microscopy and scanning electron microscopy.