Non-destructive and innovative analysis of solid metal glasses using X-ray computed tomography
How we used EasyTom S to reveal defects in metallic glass samples and much more.
Read the full article here...
Meet us here – SAOG meeting, Fribourg, Switzerland
February 6th, 2026 –
Meet us at 38th SAOG meeting, Fribourg, Switzerland
Uncovering the past with CT technology
The CT system series from RX Solutions opens completely new perspectives in archaeology and materials analysis.
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From manual to autonomous – Sample loader for your CT system
Automate your CT system in 24/7 mode with the RX Sample Loader.
Explore the possibilities ...
Exclusive Auger User Workshop at TU Wien
16 October 2025 AIC (Analytical Instrumentation Centre) at TU Wien, Austria
Exclusive NenoVision Workshop at IKTS Dresden
11 September 2025 Fraunhofer Institute for Ceramic Technologies and Systems IKTS, Dresden, Germany
Meet us here – AOFKA2025
Meet us at the conference "Applied Surface and Solid State Analysis" - June 30 - July 02, 2025
Subnanometer accuracy for the chip industry: TOF-SIMS in focus
TOF-SIMS tandem MS imaging provides 3D insights at the sub-nanometer level – for better processes and more reliable chips.
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Efficient NAND analysis with AFM-in-SEM
NAND error analysis with in-situ delayering and C-AFM measurement.
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HAXPES WORKSHOP Empa Akademie
You want to learn the fundamentals and applications of Hard X-ray Photoelectron Spectroscopy (HAXPES)?
Visit this workshop ...
