
Characterisation of surfaces
Surface
analytics
Understanding surfaces, layer systems and their interfaces
Photoelectron spectroscopy XPS
Time-of-flight mass spectrometer Tof-SIMS
Auger electron spectroscopy AES
Characterisation of surfaces
Surface
analytics
Understanding surfaces, layer systems and their interfaces
Photoelectron spectroscopy XPS
Time-of-flight mass spectrometer Tof-SIMS
Auger electron spectroscopy AES
