Characterisation of surfaces

Surface
analytics

Understanding surfaces, layer systems and their interfaces

  • Photoelectron spectroscopy XPS

  • Time-of-flight mass spectrometer Tof-SIMS

  • Auger electron spectroscopy AES

Characterisation of surfaces

Surface
analytics

Understanding surfaces, layer systems and their interfaces

  • Photoelectron spectroscopy XPS

  • Time-of-flight mass spectrometer Tof-SIMS

  • Auger electron spectroscopy AES

Characterisation of surfaces

Surface
analytics

Understanding surfaces, layer systems and their interfaces

  • Photoelectron spectroscopy XPS

  • Time-of-flight mass spectrometer Tof-SIMS

  • Auger electron spectroscopy AES

Characterisation of surfaces

Surface
analytics

Understanding surfaces, layer systems and their interfaces

  • Photoelectron spectroscopy XPS

  • Time-of-flight mass spectrometer Tof-SIMS

  • Auger electron spectroscopy AES

Characterisation of surfaces

Surface
analytics

Understanding surfaces, layer systems and their interfaces

  • Photoelectron spectroscopy XPS

  • Time-of-flight mass spectrometer Tof-SIMS

  • Auger electron spectroscopy AES

Characterisation of surfaces

Surface
analytics

Understanding surfaces, layer systems and their interfaces

  • Photoelectron spectroscopy XPS

  • Time-of-flight mass spectrometer Tof-SIMS

  • Auger electron spectroscopy AES

Characterisation of surfaces

Surface
analytics

Understanding surfaces, layer systems and their interfaces

  • Photoelectron spectroscopy XPS

  • Time-of-flight mass spectrometer Tof-SIMS

  • Auger electron spectroscopy AES

Characterisation of surfaces

Surface
analytics

Understanding surfaces, layer systems and their interfaces

  • Photoelectron spectroscopy XPS

  • Time-of-flight mass spectrometer Tof-SIMS

  • Auger electron spectroscopy AES

Characterisation of surfaces

Surface
analytics

Understanding surfaces, layer systems and their interfaces

  • Photoelectron spectroscopy XPS

  • Time-of-flight mass spectrometer Tof-SIMS

  • Auger electron spectroscopy AES

Characterisation of surfaces

Surface
analytics

Understanding surfaces, layer systems and their interfaces

  • Photoelectron spectroscopy XPS

  • Time-of-flight mass spectrometer Tof-SIMS

  • Auger electron spectroscopy AES

Characterisation of surfaces

Surface
analytics

Understanding surfaces, layer systems and their interfaces

  • Photoelectron spectroscopy XPS

  • Time-of-flight mass spectrometer Tof-SIMS

  • Auger electron spectroscopy AES

Characterisation of surfaces

Surface
analytics

Understanding surfaces, layer systems and their interfaces

  • Photoelectron spectroscopy XPS

  • Time-of-flight mass spectrometer Tof-SIMS

  • Auger electron spectroscopy AES

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