NanoX-Pert: Your Micro- and Nanoanalytics Seminar & Individual Analysis
October, 17th 2018
Nano X-Pert represents our inhouse seminars, which give you an overview of the most important nano-analytical methods by an interdisciplinary approach. The power of our techniques is the delivery of detailed analytical information. Get your individual first impression using the unique opportunity of a free test measurement. Our Scientists will work with you to solve your analytical challenge.
The seminar introduces nano-analytical methods in the following areas:
- Surface Analysis (XPS; TOF-SIMS & AES)
- Combination of AFM-IR Spectroscopy ; submicron IR Microscope
Free coupon for a private measurement day and the unique opportunity to get an individual impression of the potential of our techniques with your samples.
This means in detail, a complete day in our lab to test our surface science methods XPS, TOF-SIMS & AES (possible as combination-Analysis too).
Latest developments in surface analysis like Parallel Imaging MS/MS – NEW! Changing TOF-SIMS from I Think to I know!, will be shown. What is / Why XPS/HAXPES ? Dual Scanning X-ray Photoelectron Microprobe Equipped with Hard X-Ray will be presented in all NanoX-Pert Seminars.
Physical Electronics GmbH
Your contact person:
Telefon: +49 89 96275 0