NanoX-Pert Seminar – April 16th, 2024
Cleanliness of the surface (TOF-SIMS, XPS, Auger)
We are pleased to invite you to our next "NanoX-Pert" seminar.
Tuesday, 16.04.2024 from 9:00 am to 4:30 pm.
As usual, the seminar will be held at our laboratory in Feldkirchen. The participation fee is 100,00 Euro plus VAT.
Our experts for surface analysis are looking forward to presenting our three methods (XPS, AES and TOF-SIMS).
Once again, we have been able to attract a professional guest speaker from the industry. You can look forward to Dr Lothar Höllt from KETEK GmbH. His talk will be entitled "Surface Analysis for silicon drift detectors".
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Among the exciting content of the day, we also offer an analysis voucher to new customers who would like to test our methods on their samples. Nothing is more educational than your own experience!
