Advanced materials with complex interfaces, layer structures or small features are often needed to significantly improve products.
To characterize these materials dedicated analytical instruments with high spatial resolution, depth profiling capabilities, high surface sensitivity and great imaging are needed. Surface analytical techniques and nanoscale IR Spectroscopy offer these capabilities and are therefore widely used to characterize advanced materials. Our techniques cover a spatial resolution from a few nm to the µm range.
These techniques include:
- X-ray Photoelectron Spectroscopy (XPS)
- Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)
- Auger electron spectroscopy (AES)
- Atomic Force Microscopy combined with IR Spectroscopy (AFM-IR)
- Sub-micron IR Microscope
- Recycling preparative High Performance Liquid Chromatography (HPLC) for organic analysis
Surface Analysis techniques help you to understand the composition of the outer most atomic layers of a material which plays a critical role in properties such as: chemical activity, adhesion, wettability, electrostatic behavior, corrosion resistance, bio-compatibility, etc.
XPS, TOF-SIMS and AES are the classical surface analysis techniques. They detect electrons or ions emitted from the surface using different excitation beams. Typical is the characterization and imaging of chemical and elemental composition.
The ability to characterize thin film structures, via sputter depth profiling, provides a unique opportunity to examine the materials used in thin layers and to study their interaction with materials in adjacent layers.
All Surface Analysis techniques require ultra-high vacuum.
Nanoscale IR Spectroscopy
Based on proprietary photothermal infrared techniques, our products allow the IR spectroscopy with a spatial resolution that has not been possible before.
Depending on your type of samples two different instruments are available. Both allow the usage of your existing IR database but significantly improve the spatial resolution even down to 10nm.
Finally, it is possible to use IR Spectroscopy in nanoscale analysis.
Preparative chromatography is used to purify sufficient quantities of a substance. The key to improve separation in Preparative HPLC is the column length. However, there is a limit in column length due to back pressure. To solve this, recycling technique can be applied. With recycling technique, the chromatographic resolution increases by the square root of number of passes through the column and there is no solvent consumption.
Physical Electronics GmbH
Your contact person:
Telefon: +49 89 96275 0