Surface Analysis techniques help you to understand the composition of the outer most atomic layers of a material which plays a critical role in properties such as: chemical activity, adhesion, wettability, electrostatic behavior, corrosion resistance, bio-compatibility, etc.
XPS, TOF-SIMS and AES are the classical surface analysis techniques. They detect electrons or ions emitted from the surface using different excitation beams. Typical is the characterization and imaging of chemical and elemental composition.
The ability to characterize thin film structures, via sputter depth profiling, provides a unique opportunity to examine the materials used in thin layers and to study their interaction with materials in adjacent layers.
All Surface Analysis techniques require ultra-high vacuum.