X-ray CT provides completely new insights into the invisible. They can be used to analyze, measure, detect and inspect internal structures, fast and non-destructively. The CT systems portfolio covers a large scale of analysis, from micro (4 µm) to nano (0.35 µm).
- Micro CT
- Nano CT
- Combined Versions: Micro and Nano- CT
The high performance computed tomography (CT) systems, are available in different inspection volumes, too. All systems include RX Solution Software: X- ACT with its powerful and easy to use Reconstruction Artefacts Correction Algorithms!
- Combine high-resolution X-ray micro and nano- CT Analyses in the same cabinet!
- Versatility & Reliability!
- Inspect both the external and internal structures of a part or object in a non-destructive way!
- More axes, contrary to most of other CT systems which are best to scan any kind of sample!
- High speed scanning, fastest scan 6s!
- Powerful and easy to use reconstruction artefacts correction algorithms!
- High resolution 3D μComputed Tomography
- Real time high resolution 2D digital radioscopy