Redux AFM
Patented AFM-on-a-chip Technology
The Redux AFM is an automated, laserless system; the integrated piezoresistive sensor allows for alignment-free operation and a fully automatic approach – so you can collect your data effortlessly.
All of the sensors and scanners of traditional AFM instruments have been
integrated onto a single 1 mm x 1 mm chip.
Long Lifetime
Redux AFM tips are made of hard, durable materials like diamond-like carbon and aluminum oxide, with 1000+ scan lifetime.
3D images at the nanoscale in 3 clicks
A higher level of automation
- Easy set-up: laserless AFM system (no laser alignment)
- Automatic approach: one-click automatic approach in seconds
- Simple sample positioning: motorized XY stage and integrated optical microscope
- Collect topography, phase images, film thickness, roughness, particle size and more
Fastest time to data for small sample AFM
- From sample loading to data in two minutes (256 x 256 pixel scan)
- Automatic frequency sweep, automatic approach and fast scanning
- Up to 1024 x 1024 scans at <0.15 nm noise floor (available on Redux Pro)
Ultra-durable probes with 1000+ scan lifetime
- Ultra-durable materials: diamond-like carbon (DLC)
- Ultra-low tapping force: no sample damage and compatible with soft samples such as elastomers
- No more tedious silicon tip changes: simple tip cartridge changes every 1,000 scans
- The only AFM with an easy-to-use tip cartridge
- Tip cartridge system features TipGuard technology that prevents tip crashes
nGauge AFM
The nGauge MEMS based AFM, is the world’s first AFM on a Chip. It is easy to use, fast and a flexible benchtop instrument.
Atomic Force Microscopy is a technique to image surfaces at the nanoscale.
Typical Application areas are:
- Polymers and Composites
- Semiconductor Devices
- Nanoparticles and Nanomaterials
- Biology and Life Science
You need fast AFM data without a complicated setup and measurement process?
Using the nGauge you will find Atomic Force Microscopy faster and much easier to use as it was used to be. Within three clicks you are able to analyze your samples and get results approximately 10 times faster compared to conventional AFM.
AFM is not a complicated expensive technique anymore. The nGauge makes AFM affordable for all interested users in Industry, R&D and at Universities.
AFM in three simple steps
3D Nanoscale Images in three simple steps:
- Frequency Sweep
- Approach
- Scan
Since the nGauge does not require a laser, there is no laser alignment necessary.
You can operate the instrument in your standard lab environment without the need for special vibration isolation. From unpacking the instrument to the first scan, only a few minutes pass. The scan itself is also approximately 10 times faster compared to conventional AFM.
Atomic Force Microscopy was never more efficient.
Contact us
Physical Electronics GmbH
Salzstraße 8
85622 Feldkirchen near Munich
Germany
Telephone: +49 89 96275 0
Email: info@phi-europe.com
Lab: lab@phi-europe.com
Service: euroserv@phi-europe.com
