nGauge Atomic Force Microscope

nGauge AFM Specifications:

General:
Mode of operation:   Tapping mode
Operation environment:   Ambient air, dry samples
Scan types:  Topography, phase and error

Tip Specifications:
Tip specifications are available on nGauge tip product page

Lateral Scanning:
Maximum scan area:   20 µm × 20 µm
Maximum line scan length:   60 µm
XY scanner resolution:   <0.5 nm

Vertical scanning:
Z Scanner range (Rz):   10 µm
Noise floor (dynamic):   <0.5 nm rms

Data Acquisition:
Scan speed:
Quick scan (128 x 128 pixel):   16 seconds
Regular scan (256 x 256 pixel):   80 seconds
High resolution (512 x 512 pixel):   5 minutes

Image resolution:   Up to 1024 x 1024 pixels²

Sample Platform:
Sample stage area:   70 mm × 42 mm
Z stage travel:   20 mm

XY Stage:
Travel axes:   X, Y
Maximum travel:   12 mm (X), 10 mm (Y)
Sensitivity:   1 μm

Sample Dimensions and Weight:
Maximum sample weight:   1 kg
Maximum recommended sample size:   100 mm × 50 mm × 16 mm (L×W×H)
Samples can be larger as long as the sample can be firmly held in place.

Features

Removable Sample Stage:
The sample stage is easily removable by loosening two set screws, allowing you to customize the nGauge to suit your needs.

Mounting hole:
The base plate features a 7-mm mounting hole that works perfectly for securing the nGauge unit to an optical table (M6 or 1/4-20 screws).

Hardware specifications:

Unit dimensions and weight:
Unit dimensions (L×W×H):   70 mm × 90 mm × 75 mm
Unit weight:   450 g
Total weight (with carrying case):   1.5 kg

Connections:
Communication:   USB
Power Supply:   100-240 VAC to 7.5 VDC

Electrical:
DAC Resolution:   16 bits (ENOB > 20 bits)
ADC Resolution:   12 bits (ENOB > 19 bits)

*ENOB: effective number of bits over 3.3 V