Collect topography, phase, roughness, film thickness, particle size and more with a higher level of automation with the Redux AFM

The Redux AFM allows you to:

  • Go from loading your sample to data in just two minutes
  • Collect your data in 3 clicks with an automatic sweep and approach
  • Easily locate the area you need to scan with a motorized stage and integrated optical microscope
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Contact us

Physical Electronics GmbH
Salzstraße 8
85622 Feldkirchen near Munich
Germany

Telephone: +49 89 96275 0
Email: info@phi-europe.com
Lab: lab@phi-europe.com
Service: euroserv@phi-europe.com

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