ICSPI Redux AFM
A higher level of automation AFM
The ICSPI Redux is a benchtop AFM tool based on the patented AFM-on-a-Chip technology. In this AFM all scanners and sensors are integrated into a single 1 x 1 mm2 CMOS-MEMS chip and therefore nanoscale imaging has never been easier.
The Redux AFM provides a higher level of automation compared to the nGauge. It has a preinstalled camera for easier sample navigation and a motorized X-Y stage. Moreover, it comes with tip cartridge with TipGuard technology to prevent tip crashes. The environmental cover of the Redux AFM provides a higher degree of shielding of unwanted external influences like sound or draughts.
Atomic Force Microscopy (AFM) is one of the most used surface science techniques to investigate topography, surface roughness and thickness of coatings on different substrate materials. A very sharp tip or cantilever is moving across the surface giving height and mechanical information on the nanoscale. The nGauge is working in the so-called tapping mode providing very long cantilever lifetimes and 1000+ scans.
The ICSPI AFM-on-a-Chip approach resulted in an alignment-free, laser-less and cost-effective AFM tool.
The Redux AFM offers a simple benchtop set-up and plug-and-play operation providing first results within a few minutes.
System Benefits
- Fast – Collect data in less than 2 minutes
- Easy to use – collect scans in 3 clicks
- Benchtop – small footprint and low weight (4 kg)
- Laser-less system – no calibration/alignment
- Ultra-durable probes – 1000+ scans possible
Application Areas
Tip cartridge
TipGuard technology prevents tip crashes.
Motorized X-Y stage and pre-installed camera
Replaces the manual X-Y stage in the nGauge for easier sample navigation.
Environmental cover
Reduces the influence of sound and draught making the Redux a more reliable tool.
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