Alemnis In Situ Nanoindenter

Alemnis In Situ Nanoindenter is an ultra felxible instrument for testing IN-SEM and IN-AIR. A compact instrument for easy installation in confined spaces. Nanomechanical Testing at high dynamic and high temperature conditions. Pushing the frontier of nano-mechanical testing!

  • TRIFT mass analyzer
  • 30 kV LMIG with Bi, Au, or Ga emitter
  • Primary indentation mode : True displacement
  • Open source software
  • Stage accuracy with 2nm!
  • Stand-alone instrument, compact design
  • Indentation load: 0.5N (4uN RMS Noise@200Hz, axial compliance: 4.7um/N) (optional up to 1.5N)
  • Maximum indention depth: 35um (sub-nm resolution)
  • XY closed loop sample micro-positioning system
  • 10x10mm sample covering area (1nm resolution)
  • 22mm range positioning system in Z-axis for easy setup of sample height (1nm resolution)
  • Weight: approx. 500g
  • Characterization of organic, inorganic, soft or hard materials and coatings.
  • Biomaterials
  • Ceramics and Polymers
  • Hard coatings and Thin films
  • MEMS and Semiconductors
  • In-situ experiments
  • Surface characterization of metals, semiconductors, glasses, composites
  • Mechanical and electrical characterization
  • Tensile Testing of Nanostructures
  • Compression Testing of Micro/Nanopillars
  • Nanoindentation of thin films
  • Bending, and electrical property probing on individual nanostructures, as well as the state-of-the-art electromechanical coupling analysis
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Contact us

Physical Electronics GmbH
Salzstraße 8
85622 Feldkirchen near Munich
Germany

Your contact person: Thomas Groß
Telefon: +49 89 96275 0
E-Mail: eurosales@phi-europe.com

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