Alemnis In Situ Nanoindenter
Alemnis In Situ Nanoindenter is an ultra felxible instrument for testing IN-SEM and IN-AIR. A compact instrument for easy installation in confined spaces. Nanomechanical Testing at high dynamic and high temperature conditions. Pushing the frontier of nano-mechanical testing!
- Primary indentation mode : True displacement
- Open source software
- Stage accuracy with 2nm!
- Stand-alone instrument, compact design
- Indentation load: 0.5N (4uN RMS Noise@200Hz, axial compliance: 4.7um/N) (optional up to 1.5N)
- Maximum indention depth: 35um (sub-nm resolution)
- XY closed loop sample micro-positioning system
- 10x10mm sample covering area (1nm resolution)
- 22mm range positioning system in Z-axis for easy setup of sample height (1nm resolution)
- Weight: approx. 500g
- Characterization of organic, inorganic, soft or hard materials and coatings.
- Biomaterials
- Ceramics and Polymers
- Hard coatings and Thin films
- MEMS and Semiconductors
- In-situ experiments
- Surface characterization of metals, semiconductors, glasses, composites
- Mechanical and electrical characterization
- Tensile Testing of Nanostructures
- Compression Testing of Micro/Nanopillars
- Nanoindentation of thin films
- Bending, and electrical property probing on individual nanostructures, as well as the state-of-the-art electromechanical coupling analysis
Contact us
Physical Electronics GmbH
Salzstraße 8
85622 Feldkirchen near Munich
Germany
Telefon: +49 89 96275 0
E-Mail: eurosales@phi-europe.com
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