Identifying elements and molecular fragments with TOF-SIMS

PHI’s patented TRIFT mass spectrometer provides superior sensitivity, low spectral background, and the unique ability to image highly topographic surfaces. The TOF-SIMS system can be configured with a wide variety of options to optimize performance for organic materials, inorganic materials, or both, depending on customer requirements. The newest option for the nanoTOF II TOF-SIMS system, Parallel Imaging MS/MS, allows secondary ions of choice to be extracted from the TOF-SIMS data stream for fragmentation and analysis in a separate TOF analyzer.  This provides for unambiguous peak identification and parallel tandem MS imaging capability. Changing TOF-SIMS from I Think to I know!

Back

Contact us

Physical Electronics GmbH
Salzstraße 8
85622 Feldkirchen near Munich
Germany

Your contact person: Thomas Groß
Telefon: +49 89 96275 0
E-Mail: eurosales@phi-europe.com

For privacy reasons Google Maps needs your permission to be loaded. For more details, please see our Privacy Policy.
I Accept