Identifying elements and molecular fragments with TOF-SIMS

PHI’s patented TRIFT mass spectrometer provides superior sensitivity, low spectral background, and the unique ability to image highly topographic surfaces. The TOF-SIMS system can be configured with a wide variety of options to optimize performance for organic materials, inorganic materials, or both, depending on customer requirements. The newest option for the nanoTOF II TOF-SIMS system, Parallel Imaging MS/MS, allows secondary ions of choice to be extracted from the TOF-SIMS data stream for fragmentation and analysis in a separate TOF analyzer.  This provides for unambiguous peak identification and parallel tandem MS imaging capability. Changing TOF-SIMS from I Think to I know!


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Physical Electronics GmbH
Salzstraße 8
85622 Feldkirchen near Munich

Telephone: +49 89 96275 0

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