Identifying elements and molecular fragments with TOF-SIMS
PHI’s patented TRIFT mass spectrometer provides superior sensitivity, low spectral background, and the unique ability to image highly topographic surfaces. The TOF-SIMS system can be configured with a wide variety of options to optimize performance for organic materials, inorganic materials, or both, depending on customer requirements. The newest option for the nanoTOF II TOF-SIMS system, Parallel Imaging MS/MS, allows secondary ions of choice to be extracted from the TOF-SIMS data stream for fragmentation and analysis in a separate TOF analyzer. This provides for unambiguous peak identification and parallel tandem MS imaging capability. Changing TOF-SIMS from I Think to I know!
- TRIFT mass analyzer
- 30 kV LMIG with Bi, Au, or Ga emitter
- Dual beam charge neutralization
- 5 axis sample stage
- In-situ optical viewing
- Secondary electron detector
- WinCadence instrument control and data reduction software package
- Analysis chamber with four primary ion gun ports
- 350 l/s turbo molecular pump
- Integrated bakeout facilities
- Integrated MS/MS spectrometer
- Lithium Battery Electrode Analysis
- Fuel Cell Membrane Characterization
- Solid Oxide Fuel Cell Characterization
- Drug Absorption
- 3D Characterization of a Drug Eluting Coating
- Hard Disk Thin film Composition
- Tribology on Magnetic Media Heads
- Silicon Nanowires
- Semiconductor Packaging
- Plasma Modified Polymer Surface
- Contaminant Identification On Polymer Surfaces
- Polymer Film Depth Profiling
- 3D Polymer Film Depth Profiling
- Molecular ‘imaging with High Spatial Resolution and High Mass Resolution (HR2)
- Characterizing Tribo -Surface Chemistry
- Corrosion Studies
- Semiconductor Films
- Magnetic Storage Media
- Organic Electronics
- Organic Photovoltaics
Contact us
Physical Electronics GmbH
Salzstraße 8
85622 Feldkirchen near Munich
Germany
Telephone: +49 89 96275 0
Email: info@phi-europe.com
Lab: lab@phi-europe.com
Service: euroserv@phi-europe.com