Greater XPS depth Analysis using Two Different Energy X-rays, a hard and soft X-ray source at the same spot

Why HAXPES? HAXPES using Cr x-rays offers 3× greater depth of analysis compared to conventional XPS.

This state-of-the-art XPS instrument has a capability to analyze the very small area where the user is interested in and a large area of the uniform sample surface. The PHI Quantes is equipped with a dual scanning X-ray source composed of a hard X-ray source (Cr K?) and a conventional soft X-ray source (Al K?), which have different energy values. The two different types of X-ray sources can be switched automatically, allowing users to analyze the same area and/or points of a sample.

The PHI Quantes is an XPS instrument designed to pioneer new methods and applications transcending conventional ideas of what is possible with greater depth of analysis.


Contact us

Physical Electronics GmbH
Fraunhoferstr. 4
85737 Ismaning

Your contact person: Thomas Groß
Telefon: +49 89 96275 0
E-Mail: eurosales@phi-europe.com

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